TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_44_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-015-04 | FUSED_ID : 6359364768399126772
  IC_TEMP :  -51.95 | VDDM : 1132.57 | AUX_INT :   -7.83 | CsaBias :   83.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14212e-03 / 2
  ADC_P0  : -7.83265e-03 ± 2.29234e-02
  ADC_P1  : 8.34954e-03 ± 5.68786e-04
  ADC_P2  : -5.27946e-06 ± 2.80247e-06
  CSA_Chi2/NDF : 1.14103e-04 / 2
  CSA_P0  : 5.85692e-02 ± 7.12477e-03
  CSA_P1  : 9.79321e-03 ± 5.36800e-04
  CSA_P2  : -4.44414e-05 ± 8.17482e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 9, 27, 33, 34, 94, 110, 124, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 9, 16, 28, 86, 103, 105, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4260', '1.800', '0.1537', '1.800', '0.0902', '7.000', '0.7079', 1, 1, 1, 1, 1726130664.808637]
VI_after__Init : ['1.202', '0.4256', '1.800', '0.1538', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1726130673.0030272]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1395', '1.800', '0.1140', '7.000', '0.7086', 1, 1, 1, 1, 1726130739.8949573]