TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_42_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-016-03 | FUSED_ID : 6359364768399126787
  IC_TEMP :  -49.71 | VDDM : 1129.41 | AUX_INT :   -6.01 | CsaBias :   83.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.29126e-04 / 2
  ADC_P0  : -6.01403e-03 ± 1.82825e-02
  ADC_P1  : 8.20970e-03 ± 4.49073e-04
  ADC_P2  : -5.15423e-06 ± 2.17977e-06
  CSA_Chi2/NDF : 1.17319e-04 / 2
  CSA_P0  : 5.88322e-02 ± 7.22447e-03
  CSA_P1  : 9.82836e-03 ± 5.44312e-04
  CSA_P2  : -4.42962e-05 ± 8.28923e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 20, 32, 38, 77, 100, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 24, 34, 52, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4113', '1.800', '0.1948', '1.800', '0.0916', '7.000', '0.7079', 1, 1, 1, 1, 1726130567.113042]
VI_after__Init : ['1.202', '0.4115', '1.800', '0.1949', '1.800', '0.0859', '7.000', '0.7078', 1, 1, 1, 1, 1726130575.8183768]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1394', '1.800', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1726130642.5363166]