TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_34_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-021-03 | FUSED_ID : 6359364768399126867
  IC_TEMP :  -46.81 | VDDM : 1102.78 | AUX_INT :   -2.05 | CsaBias :   70.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.96803e-04 / 2
  ADC_P0  : -2.04926e-03 ± 2.13375e-02
  ADC_P1  : 8.05764e-03 ± 5.17869e-04
  ADC_P2  : -5.19103e-06 ± 2.47703e-06
  CSA_Chi2/NDF : 6.28105e-05 / 2
  CSA_P0  : 6.04286e-02 ± 5.28614e-03
  CSA_P1  : 9.37175e-03 ± 3.98272e-04
  CSA_P2  : -3.78592e-05 ± 6.06522e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 11, 24, 39, 54, 99, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [42, 54, 78, 83, 86, 87, 94, 104, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3921', '1.800', '0.1406', '1.800', '0.0921', '7.000', '0.7077', 1, 1, 1, 1, 1726130082.366166]
VI_after__Init : ['1.202', '0.3922', '1.800', '0.1398', '1.800', '0.0864', '7.000', '0.7079', 1, 1, 1, 1, 1726130090.5026813]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1403', '1.800', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1726130158.6664503]