TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_33_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-022-03 | FUSED_ID : 6359364768399126883
  IC_TEMP :  -56.46 | VDDM : 1126.99 | AUX_INT :   -9.36 | CsaBias :   69.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39382e-03 / 2
  ADC_P0  : -9.36253e-03 ± 2.52837e-02
  ADC_P1  : 8.81175e-03 ± 6.43590e-04
  ADC_P2  : -6.72295e-06 ± 3.25785e-06
  CSA_Chi2/NDF : 1.48594e-04 / 2
  CSA_P0  : 5.96702e-02 ± 8.13061e-03
  CSA_P1  : 1.00299e-02 ± 6.12582e-04
  CSA_P2  : -4.86442e-05 ± 9.32891e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [42, 81, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [34, 70, 94, 100, 104, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3932', '1.800', '0.1832', '1.800', '0.0956', '7.000', '0.7079', 1, 1, 1, 1, 1726129985.341715]
VI_after__Init : ['1.201', '0.3931', '1.800', '0.1831', '1.800', '0.0904', '7.000', '0.7081', 1, 1, 1, 1, 1726129993.4110816]
VI_at__the_End : ['1.202', '0.4947', '1.800', '0.1420', '1.800', '0.1142', '7.000', '0.7087', 1, 1, 1, 1, 1726130054.4583633]