TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_05_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-002-00 | FUSED_ID : 6359364768399130656
  IC_TEMP :  -50.57 | VDDM : 1116.26 | AUX_INT :   -6.32 | CsaBias :   92.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07529e-03 / 2
  ADC_P0  : -6.31665e-03 ± 2.22223e-02
  ADC_P1  : 8.26814e-03 ± 5.47019e-04
  ADC_P2  : -5.52229e-06 ± 2.64991e-06
  CSA_Chi2/NDF : 1.09655e-04 / 2
  CSA_P0  : 5.66466e-02 ± 6.98451e-03
  CSA_P1  : 9.01070e-03 ± 5.26233e-04
  CSA_P2  : -3.37131e-05 ± 8.01390e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 21, 40, 43, 44, 60, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [11, 21, 33, 82, 92, 100, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2743', '1.800', '0.1367', '1.800', '0.0336', '7.000', '0.7059', 1, 1, 1, 1, 1726131917.446085]
VI_after__Init : ['1.202', '0.2744', '1.800', '0.1366', '1.800', '0.0845', '7.000', '0.7078', 1, 1, 1, 1, 1726131926.2544637]
VI_at__the_End : ['1.202', '0.4850', '1.800', '0.1374', '1.800', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1726131985.413089]