TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_10_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-005-00 | FUSED_ID : 6359364768399130704
  IC_TEMP :  -54.37 | VDDM : 1129.28 | AUX_INT :   -8.72 | CsaBias :   74.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53909e-03 / 2
  ADC_P0  : -8.71511e-03 ± 2.67067e-02
  ADC_P1  : 8.36111e-03 ± 6.79296e-04
  ADC_P2  : -4.21503e-06 ± 3.45115e-06
  CSA_Chi2/NDF : 1.56827e-04 / 2
  CSA_P0  : 6.01288e-02 ± 8.35283e-03
  CSA_P1  : 1.04014e-02 ± 6.29325e-04
  CSA_P2  : -5.24375e-05 ± 9.58388e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [15, 20, 93, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 74, 117, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2502', '1.800', '0.1749', '1.800', '0.0919', '7.000', '0.7080', 1, 1, 1, 1, 1726132208.7457712]
VI_after__Init : ['1.202', '0.2502', '1.800', '0.1749', '1.800', '0.0861', '7.000', '0.7078', 1, 1, 1, 1, 1726132216.9611745]
VI_at__the_End : ['1.202', '0.5030', '1.800', '0.1431', '1.799', '0.1125', '7.000', '0.7086', 1, 1, 1, 1, 1726132281.236557]