TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_21_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-012-00 | FUSED_ID : 6359364768399130816
  IC_TEMP :  -48.33 | VDDM : 1125.81 | AUX_INT :   -7.83 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14212e-03 / 2
  ADC_P0  : -7.83265e-03 ± 2.29234e-02
  ADC_P1  : 8.34954e-03 ± 5.68786e-04
  ADC_P2  : -5.27946e-06 ± 2.80247e-06
  CSA_Chi2/NDF : 1.23840e-04 / 2
  CSA_P0  : 5.96459e-02 ± 7.42254e-03
  CSA_P1  : 1.00157e-02 ± 5.59235e-04
  CSA_P2  : -4.60380e-05 ± 8.51648e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [47, 61, 71, 76, 86, 102, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [13, 20, 21, 24, 70, 99, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2816', '1.800', '0.1262', '1.800', '0.0917', '7.000', '0.7080', 1, 1, 1, 1, 1726132887.7291932]
VI_after__Init : ['1.202', '0.2816', '1.800', '0.1262', '1.800', '0.0865', '7.000', '0.7078', 1, 1, 1, 1, 1726132895.9925873]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1436', '1.801', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1726132960.4466288]