TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_23_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-013-00 | FUSED_ID : 6359364768399130832
  IC_TEMP :  -55.43 | VDDM : 1132.23 | AUX_INT :   -7.73 | CsaBias :   75.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13795e-03 / 2
  ADC_P0  : -7.72824e-03 ± 2.28816e-02
  ADC_P1  : 8.34468e-03 ± 5.67748e-04
  ADC_P2  : -5.26695e-06 ± 2.79735e-06
  CSA_Chi2/NDF : 1.40011e-04 / 2
  CSA_P0  : 5.89293e-02 ± 7.89229e-03
  CSA_P1  : 1.00207e-02 ± 5.94627e-04
  CSA_P2  : -4.96808e-05 ± 9.05546e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [5, 14, 87, 96, 99, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 11, 28, 44, 51, 52, 89, 108, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3260', '1.800', '0.1116', '1.800', '0.0897', '7.000', '0.7086', 1, 1, 1, 1, 1726132984.1229115]
VI_after__Init : ['1.202', '0.3260', '1.800', '0.1116', '1.800', '0.0828', '7.000', '0.7082', 1, 1, 1, 1, 1726132992.2083285]
VI_at__the_End : ['1.202', '0.4920', '1.800', '0.1371', '1.803', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1726133055.4154878]