TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_24_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-014-00 | FUSED_ID : 6359364768399130848
  IC_TEMP :  -51.14 | VDDM : 1127.01 | AUX_INT :   -8.52 | CsaBias :   81.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27071e-03 / 2
  ADC_P0  : -8.51743e-03 ± 2.41455e-02
  ADC_P1  : 8.25585e-03 ± 5.81898e-04
  ADC_P2  : -5.72911e-06 ± 2.78141e-06
  CSA_Chi2/NDF : 1.08396e-04 / 2
  CSA_P0  : 6.00746e-02 ± 6.94432e-03
  CSA_P1  : 9.78260e-03 ± 5.23204e-04
  CSA_P2  : -4.39437e-05 ± 7.96778e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 47, 49, 71, 100, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 36, 55, 59, 104, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3404', '1.800', '0.1636', '1.800', '0.0868', '7.000', '0.7089', 1, 1, 1, 1, 1726133081.1865456]
VI_after__Init : ['1.202', '0.3407', '1.800', '0.1637', '1.800', '0.0797', '7.000', '0.7080', 1, 1, 1, 1, 1726133089.2889872]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1408', '1.800', '0.1118', '7.000', '0.7088', 1, 1, 1, 1, 1726133151.623294]