TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_26_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-015-00 | FUSED_ID : 6359364768399130864
  IC_TEMP :  -49.42 | VDDM : 1129.23 | AUX_INT :   -6.75 | CsaBias :   86.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22663e-03 / 2
  ADC_P0  : -6.74570e-03 ± 2.38092e-02
  ADC_P1  : 7.84158e-03 ± 5.67653e-04
  ADC_P2  : -4.12568e-06 ± 2.68010e-06
  CSA_Chi2/NDF : 1.06430e-04 / 2
  CSA_P0  : 5.72226e-02 ± 6.88104e-03
  CSA_P1  : 9.58533e-03 ± 5.18436e-04
  CSA_P2  : -4.15438e-05 ± 7.89517e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [28, 37, 60, 62, 72]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [72, 76, 87, 101, 102, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3536', '1.800', '0.1999', '1.800', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1726133178.0973222]
VI_after__Init : ['1.202', '0.3539', '1.800', '0.1997', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1726133186.2416887]
VI_at__the_End : ['1.202', '0.4910', '1.800', '0.1384', '1.799', '0.1126', '7.000', '0.7086', 1, 1, 1, 1, 1726133246.367211]