TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_29_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-017-07 | FUSED_ID : 6359364768399130903
  IC_TEMP :  -56.79 | VDDM : 1134.43 | AUX_INT :   -6.45 | CsaBias :   80.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.75899e-04 / 2
  ADC_P0  : -6.44607e-03 ± 2.00211e-02
  ADC_P1  : 8.77526e-03 ± 5.16446e-04
  ADC_P2  : -6.58235e-06 ± 2.62631e-06
  CSA_Chi2/NDF : 1.47468e-04 / 2
  CSA_P0  : 6.02479e-02 ± 8.09975e-03
  CSA_P1  : 1.01288e-02 ± 6.10258e-04
  CSA_P2  : -4.85266e-05 ± 9.29350e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 38, 55, 73, 89, 91, 97, 98, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [45, 58, 77, 85, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0247', '1.800', '0.1658', '1.800', '0.0863', '7.000', '0.7086', 1, 1, 1, 1, 1726133373.207579]
VI_after__Init : ['1.202', '0.0247', '1.800', '0.1658', '1.800', '0.0793', '7.000', '0.7079', 1, 1, 1, 1, 1726133381.273929]
VI_at__the_End : ['1.202', '0.5016', '1.800', '0.1425', '1.800', '0.1137', '7.000', '0.7090', 1, 1, 1, 1, 1726133441.4544783]