TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_31_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-018-07 | FUSED_ID : 6359364768399130919
  IC_TEMP :  -56.32 | VDDM : 1132.06 | AUX_INT :   -6.96 | CsaBias :   69.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07542e-03 / 2
  ADC_P0  : -6.95714e-03 ± 2.21941e-02
  ADC_P1  : 8.51604e-03 ± 5.52435e-04
  ADC_P2  : -6.15043e-06 ± 2.72363e-06
  CSA_Chi2/NDF : 1.35757e-04 / 2
  CSA_P0  : 6.08351e-02 ± 7.77146e-03
  CSA_P1  : 1.01172e-02 ± 5.85524e-04
  CSA_P2  : -4.90545e-05 ± 8.91683e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [20, 62, 65, 73, 82, 83, 95, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 39, 42, 71, 77, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3155', '1.800', '0.1499', '1.800', '0.0905', '7.000', '0.7081', 1, 1, 1, 1, 1726133470.0832067]
VI_after__Init : ['1.202', '0.3157', '1.800', '0.1499', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1726133478.1555977]
VI_at__the_End : ['1.202', '0.4995', '1.800', '0.1422', '1.800', '0.1141', '7.000', '0.7086', 1, 1, 1, 1, 1726133541.4248366]