TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_32_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-019-07 | FUSED_ID : 6359364768399130935
  IC_TEMP :  -52.85 | VDDM : 1110.72 | AUX_INT :   -7.67 | CsaBias :   74.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01070e-03 / 2
  ADC_P0  : -7.67281e-03 ± 2.15318e-02
  ADC_P1  : 8.30912e-03 ± 5.29544e-04
  ADC_P2  : -5.39011e-06 ± 2.58481e-06
  CSA_Chi2/NDF : 1.09304e-04 / 2
  CSA_P0  : 6.11255e-02 ± 6.97333e-03
  CSA_P1  : 9.74966e-03 ± 5.25390e-04
  CSA_P2  : -4.34826e-05 ± 8.00107e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [24, 41, 56, 63, 84, 100, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 10, 77, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4436', '1.800', '0.1551', '1.800', '0.1017', '7.000', '0.7086', 1, 1, 1, 1, 1726133567.0068681]
VI_after__Init : ['1.202', '0.4438', '1.800', '0.1551', '1.800', '0.0940', '7.000', '0.7079', 1, 1, 1, 1, 1726133575.142367]
VI_at__the_End : ['1.202', '0.4973', '1.800', '0.1421', '1.800', '0.1125', '7.000', '0.7086', 1, 1, 1, 1, 1726133634.4744687]