TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_34_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-020-07 | FUSED_ID : 6359364768399130951
  IC_TEMP :  -48.11 | VDDM : 1125.49 | AUX_INT :   -7.94 | CsaBias :   84.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32422e-03 / 2
  ADC_P0  : -7.94280e-03 ± 2.46385e-02
  ADC_P1  : 8.44431e-03 ± 6.02781e-04
  ADC_P2  : -6.21287e-06 ± 2.92575e-06
  CSA_Chi2/NDF : 9.79138e-05 / 2
  CSA_P0  : 6.04728e-02 ± 6.60000e-03
  CSA_P1  : 9.44082e-03 ± 4.97263e-04
  CSA_P2  : -3.94485e-05 ± 7.57272e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [15, 26, 35, 38, 70, 73, 83, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [27, 29, 42, 43, 48, 50, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2966', '1.800', '0.1399', '1.800', '0.0913', '7.000', '0.7080', 1, 1, 1, 1, 1726133663.0031903]
VI_after__Init : ['1.202', '0.2967', '1.800', '0.1399', '1.799', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1726133671.8843458]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1390', '1.800', '0.1119', '7.000', '0.7087', 1, 1, 1, 1, 1726133732.2573264]