TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_39_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-023-07 | FUSED_ID : 6359364768399130999
  IC_TEMP :  -54.27 | VDDM : 1129.39 | AUX_INT : -116.18 | CsaBias :  -18.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46764e-03 / 2
  ADC_P0  : -1.16180e-01 ± 3.19013e-02
  ADC_P1  : 9.91236e-03 ± 7.45645e-04
  ADC_P2  : -1.13013e-05 ± 3.41926e-06
  CSA_Chi2/NDF : 1.40407e-04 / 2
  CSA_P0  : 5.75801e-02 ± 7.90345e-03
  CSA_P1  : 9.58177e-03 ± 5.95468e-04
  CSA_P2  : -4.26456e-05 ± 9.06827e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [5, 32, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [0, 13, 17, 33, 40, 44, 67, 88, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3618', '1.800', '0.1552', '1.799', '0.0914', '7.000', '0.7079', 1, 1, 1, 1, 1726133954.6545153]
VI_after__Init : ['1.202', '0.3617', '1.800', '0.1552', '1.800', '0.0861', '7.000', '0.7082', 1, 1, 1, 1, 1726133962.9147575]
VI_at__the_End : ['1.202', '0.4913', '1.800', '0.1393', '1.800', '0.1115', '7.000', '0.7087', 1, 1, 1, 1, 1726134026.9867048]