TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_40_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-024-07 | FUSED_ID : 6359364768399131015
  IC_TEMP :  -52.37 | VDDM : 1125.01 | AUX_INT :   -7.50 | CsaBias :   97.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04129e-03 / 2
  ADC_P0  : -7.50159e-03 ± 2.19030e-02
  ADC_P1  : 8.14066e-03 ± 5.37033e-04
  ADC_P2  : -4.53895e-06 ± 2.61975e-06
  CSA_Chi2/NDF : 1.56856e-04 / 2
  CSA_P0  : 5.94577e-02 ± 8.35359e-03
  CSA_P1  : 1.01990e-02 ± 6.29383e-04
  CSA_P2  : -4.92551e-05 ± 9.58476e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 25, 75, 101, 106, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [43, 86, 91, 95, 103, 109, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4553', '1.800', '0.1667', '1.799', '0.0957', '7.000', '0.7083', 1, 1, 1, 1, 1726134051.2197864]
VI_after__Init : ['1.201', '0.4557', '1.800', '0.1666', '1.800', '0.0904', '7.000', '0.7080', 1, 1, 1, 1, 1726134059.3981695]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1410', '1.799', '0.1118', '7.000', '0.7088', 1, 1, 1, 1, 1726134121.4031887]