TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_45_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-008-027-07 | FUSED_ID : 6359364768399131063
  IC_TEMP :  -58.78 | VDDM : 1128.60 | AUX_INT :   -9.74 | CsaBias :   67.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58481e-03 / 2
  ADC_P0  : -9.73788e-03 ± 2.69925e-02
  ADC_P1  : 8.68366e-03 ± 6.78823e-04
  ADC_P2  : -6.39366e-06 ± 3.39785e-06
  CSA_Chi2/NDF : 1.42075e-04 / 2
  CSA_P0  : 5.83870e-02 ± 7.95025e-03
  CSA_P1  : 1.01145e-02 ± 5.98994e-04
  CSA_P2  : -4.98929e-05 ± 9.12197e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [8, 27, 30, 35, 53, 54, 70, 89, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [25, 36, 51, 88, 106, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4211', '1.800', '0.1348', '1.799', '0.0992', '7.000', '0.7080', 1, 1, 1, 1, 1726134341.5330036]
VI_after__Init : ['1.202', '0.4215', '1.800', '0.1349', '1.800', '0.0936', '7.000', '0.7081', 1, 1, 1, 1, 1726134349.665361]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1384', '1.800', '0.1123', '7.000', '0.7086', 1, 1, 1, 1, 1726134416.666058]