TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_22_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-009-005-13 | FUSED_ID : 6359364768399134813
  IC_TEMP :  -55.84 | VDDM : 1129.05 | AUX_INT :   -6.87 | CsaBias :   67.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.38943e-04 / 2
  ADC_P0  : -6.86957e-03 ± 2.07626e-02
  ADC_P1  : 8.28732e-03 ± 5.11716e-04
  ADC_P2  : -5.35635e-06 ± 2.49538e-06
  CSA_Chi2/NDF : 1.64929e-04 / 2
  CSA_P0  : 5.81494e-02 ± 8.56585e-03
  CSA_P1  : 1.03387e-02 ± 6.45375e-04
  CSA_P2  : -5.15958e-05 ± 9.82829e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [9, 100, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [17, 32, 41, 42, 72, 90, 106, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1535', '1.800', '0.1845', '1.800', '0.0844', '7.000', '0.7070', 1, 1, 1, 1, 1726136573.656209]
VI_after__Init : ['1.202', '0.1535', '1.800', '0.1845', '1.800', '0.0787', '7.000', '0.7070', 1, 1, 1, 1, 1726136581.6915886]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1391', '1.800', '0.1133', '7.000', '0.7077', 1, 1, 1, 1, 1726136647.777544]