TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_16_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-009-009-13 | FUSED_ID : 6359364768399134877
  IC_TEMP :  -52.08 | VDDM : 1124.60 | AUX_INT :   -7.63 | CsaBias :   82.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22871e-03 / 2
  ADC_P0  : -7.63466e-03 ± 2.37503e-02
  ADC_P1  : 8.23696e-03 ± 5.74198e-04
  ADC_P2  : -5.46876e-06 ± 2.75975e-06
  CSA_Chi2/NDF : 1.08018e-04 / 2
  CSA_P0  : 6.07283e-02 ± 6.93218e-03
  CSA_P1  : 9.58761e-03 ± 5.22290e-04
  CSA_P2  : -4.19001e-05 ± 7.95386e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [42, 55, 70, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [22, 47, 48, 57, 82, 89, 108, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1777', '1.800', '0.1518', '1.800', '0.0857', '7.000', '0.7079', 1, 1, 1, 1, 1726136185.7509627]
VI_after__Init : ['1.202', '0.1777', '1.800', '0.1518', '1.800', '0.0786', '7.000', '0.7073', 1, 1, 1, 1, 1726136193.8822908]
VI_at__the_End : ['1.202', '0.4954', '1.800', '0.1387', '1.800', '0.1132', '7.000', '0.7080', 1, 1, 1, 1, 1726136254.7056003]