TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_09_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-009-013-13 | FUSED_ID : 6359364768399134941
  IC_TEMP :  -58.02 | VDDM : 1130.65 | AUX_INT :   -6.39 | CsaBias :   71.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31034e-03 / 2
  ADC_P0  : -6.39493e-03 ± 2.45572e-02
  ADC_P1  : 8.67291e-03 ± 6.31415e-04
  ADC_P2  : -6.06112e-06 ± 3.20539e-06
  CSA_Chi2/NDF : 1.35414e-04 / 2
  CSA_P0  : 6.28806e-02 ± 7.76165e-03
  CSA_P1  : 1.02696e-02 ± 5.84785e-04
  CSA_P2  : -5.10361e-05 ± 8.90558e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [33, 70, 110, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 53, 60, 99, 108, 109, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4884', '1.800', '0.1381', '1.800', '0.1042', '7.000', '0.7084', 1, 1, 1, 1, 1726135797.6047423]
VI_after__Init : ['1.202', '0.4884', '1.800', '0.1383', '1.800', '0.0964', '7.000', '0.7076', 1, 1, 1, 1, 1726135806.4359384]
VI_at__the_End : ['1.202', '0.5003', '1.800', '0.1459', '1.800', '0.1139', '7.000', '0.7084', 1, 1, 1, 1, 1726135869.3392525]