TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_03_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-009-017-10 | FUSED_ID : 6359364768399135002
  IC_TEMP :  -53.17 | VDDM : 1142.49 | AUX_INT : -171.95 | CsaBias :  -45.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.57291e-04 / 2
  ADC_P0  : -1.71953e-01 ± 2.69412e-02
  ADC_P1  : 1.07203e-02 ± 6.15931e-04
  ADC_P2  : -1.41878e-05 ± 2.75785e-06
  CSA_Chi2/NDF : 8.64298e-05 / 2
  CSA_P0  : 6.12928e-02 ± 6.20089e-03
  CSA_P1  : 9.46493e-03 ± 4.67192e-04
  CSA_P2  : -3.89101e-05 ± 7.11479e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 10, 27, 44, 56, 73, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 23, 85, 113, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2233', '1.800', '0.1810', '1.799', '0.0855', '7.000', '0.7079', 1, 1, 1, 1, 1726135410.2734203]
VI_after__Init : ['1.202', '0.2232', '1.800', '0.1808', '1.800', '0.0801', '7.000', '0.7079', 1, 1, 1, 1, 1726135418.303764]
VI_at__the_End : ['1.201', '0.4998', '1.800', '0.1422', '1.799', '0.1111', '7.000', '0.7089', 1, 1, 1, 1, 1726135477.3742845]