TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_01_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-009-018-10 | FUSED_ID : 6359364768399135018
  IC_TEMP :  -56.42 | VDDM : 1117.23 | AUX_INT :   -8.67 | CsaBias :   84.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18354e-03 / 2
  ADC_P0  : -8.67241e-03 ± 2.32651e-02
  ADC_P1  : 8.57548e-03 ± 5.75925e-04
  ADC_P2  : -6.54098e-06 ± 2.82601e-06
  CSA_Chi2/NDF : 1.47097e-04 / 2
  CSA_P0  : 6.03269e-02 ± 8.08956e-03
  CSA_P1  : 1.02776e-02 ± 6.09490e-04
  CSA_P2  : -5.00298e-05 ± 9.28181e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 16, 20, 36, 42, 52, 72, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [20, 34, 91, 97, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2684', '1.800', '0.1906', '1.800', '0.0924', '7.000', '0.7080', 1, 1, 1, 1, 1726135313.220886]
VI_after__Init : ['1.202', '0.2685', '1.800', '0.1905', '1.800', '0.0880', '7.000', '0.7080', 1, 1, 1, 1, 1726135321.2331898]
VI_at__the_End : ['1.202', '0.5050', '1.800', '0.1433', '1.800', '0.1150', '7.000', '0.7086', 1, 1, 1, 1, 1726135382.407572]