TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_52_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-009-024-10 | FUSED_ID : 6359364768399135114
  IC_TEMP :  -54.04 | VDDM : 1125.21 | AUX_INT :   -6.81 | CsaBias :   74.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21910e-03 / 2
  ADC_P0  : -6.80790e-03 ± 2.36605e-02
  ADC_P1  : 8.21882e-03 ± 5.71419e-04
  ADC_P2  : -5.63680e-06 ± 2.72879e-06
  CSA_Chi2/NDF : 1.44171e-04 / 2
  CSA_P0  : 5.83901e-02 ± 8.00868e-03
  CSA_P1  : 9.94249e-03 ± 6.03396e-04
  CSA_P2  : -4.59693e-05 ± 9.18901e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 45, 54, 79, 117, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 13, 21, 84, 104, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3292', '1.800', '0.1377', '1.800', '0.0964', '7.000', '0.7084', 1, 1, 1, 1, 1726134729.4807537]
VI_after__Init : ['1.202', '0.3293', '1.800', '0.1376', '1.801', '0.0908', '7.000', '0.7080', 1, 1, 1, 1, 1726134737.7201822]
VI_at__the_End : ['1.202', '0.4983', '1.800', '0.1400', '1.800', '0.1142', '7.000', '0.7088', 1, 1, 1, 1, 1726134799.2773712]