TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_30_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-003-03 | FUSED_ID : 6359364768399138867
  IC_TEMP :  -52.61 | VDDM : 1123.94 | AUX_INT :  -14.94 | CsaBias :   75.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.45152e-04 / 2
  ADC_P0  : -1.49434e-02 ± 2.00157e-02
  ADC_P1  : 8.27684e-03 ± 4.83249e-04
  ADC_P2  : -5.72385e-06 ± 2.30068e-06
  CSA_Chi2/NDF : 1.03017e-04 / 2
  CSA_P0  : 5.93480e-02 ± 6.76982e-03
  CSA_P1  : 9.74400e-03 ± 5.10057e-04
  CSA_P2  : -4.19617e-05 ± 7.76757e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [18, 22, 47]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [28, 54, 62, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1917', '1.800', '0.1640', '1.800', '0.0817', '7.000', '0.7072', 1, 1, 1, 1, 1726137058.27225]
VI_after__Init : ['1.202', '0.1918', '1.800', '0.1640', '1.800', '0.0761', '7.000', '0.7072', 1, 1, 1, 1, 1726137066.3465726]
VI_at__the_End : ['1.202', '0.5031', '1.800', '0.1394', '1.799', '0.1130', '7.000', '0.7079', 1, 1, 1, 1, 1726137130.2256613]