TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_32_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-004-03 | FUSED_ID : 6359364768399138883
  IC_TEMP :  -55.54 | VDDM : 1129.24 | AUX_INT :   -7.23 | CsaBias :   81.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.75632e-04 / 2
  ADC_P0  : -7.23035e-03 ± 2.11571e-02
  ADC_P1  : 8.13915e-03 ± 5.10877e-04
  ADC_P2  : -5.20707e-06 ± 2.44198e-06
  CSA_Chi2/NDF : 1.33382e-04 / 2
  CSA_P0  : 5.88468e-02 ± 7.70318e-03
  CSA_P1  : 9.64091e-03 ± 5.80379e-04
  CSA_P2  : -4.14192e-05 ± 8.83849e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 18, 22, 31, 70, 79, 92, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 8, 12, 20, 47, 77, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2579', '1.800', '0.1808', '1.800', '0.0892', '7.000', '0.7074', 1, 1, 1, 1, 1726137155.045851]
VI_after__Init : ['1.202', '0.2581', '1.800', '0.1808', '1.800', '0.0841', '7.000', '0.7073', 1, 1, 1, 1, 1726137163.2091572]
VI_at__the_End : ['1.202', '0.4978', '1.800', '0.1394', '1.800', '0.1120', '7.000', '0.7083', 1, 1, 1, 1, 1726137226.4293911]