TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_35_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-006-03 | FUSED_ID : 6359364768399138915
  IC_TEMP :  -51.25 | VDDM : 1122.52 | AUX_INT :   -7.85 | CsaBias :   81.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16222e-03 / 2
  ADC_P0  : -7.85062e-03 ± 2.31089e-02
  ADC_P1  : 8.22054e-03 ± 5.59882e-04
  ADC_P2  : -5.44134e-06 ± 2.68846e-06
  CSA_Chi2/NDF : 1.06980e-04 / 2
  CSA_P0  : 6.11701e-02 ± 6.89879e-03
  CSA_P1  : 9.82542e-03 ± 5.19774e-04
  CSA_P2  : -4.33196e-05 ± 7.91554e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  28
 | N_BROKEN_FAST :  [4, 33, 45, 63, 70, 109, 112, 121, 127]
 | N_BROKEN_SLOW :  [41, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63]
   P_BROKEN_DISC :  24
 | P_BROKEN_FAST :  [1, 3, 32, 63, 80, 93, 124]
 | P_BROKEN_SLOW :  [41, 46, 47, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 62, 63, 64]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2354', '1.800', '0.1462', '1.800', '0.0842', '7.000', '0.7073', 1, 1, 1, 1, 1726137349.7809598]
VI_after__Init : ['1.201', '0.2354', '1.800', '0.1461', '1.801', '0.0790', '7.000', '0.7075', 1, 1, 1, 1, 1726137357.9532092]
VI_at__the_End : ['1.202', '0.5057', '1.800', '0.1427', '1.799', '0.1115', '7.000', '0.7083', 1, 1, 1, 1, 1726137423.4703414]