TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_39_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-008-03 | FUSED_ID : 6359364768399138947
  IC_TEMP :  -52.22 | VDDM : 1125.54 | AUX_INT :   -7.68 | CsaBias :   87.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56665e-03 / 2
  ADC_P0  : -7.67718e-03 ± 2.68885e-02
  ADC_P1  : 7.98431e-03 ± 6.36626e-04
  ADC_P2  : -4.88112e-06 ± 2.99272e-06
  CSA_Chi2/NDF : 9.44453e-05 / 2
  CSA_P0  : 6.03377e-02 ± 6.48205e-03
  CSA_P1  : 9.54708e-03 ± 4.88376e-04
  CSA_P2  : -4.26022e-05 ± 7.43739e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 17, 48, 58, 97, 99, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 42, 76, 86, 93, 109, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4407', '1.800', '0.1496', '1.800', '0.0927', '7.000', '0.7076', 1, 1, 1, 1, 1726137543.277092]
VI_after__Init : ['1.202', '0.4410', '1.800', '0.1497', '1.800', '0.0868', '7.000', '0.7076', 1, 1, 1, 1, 1726137551.3695302]
VI_at__the_End : ['1.201', '0.4892', '1.800', '0.1363', '1.801', '0.1132', '7.000', '0.7084', 1, 1, 1, 1, 1726137614.6197047]