TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_42_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-010-03 | FUSED_ID : 6359364768399138979
  IC_TEMP :  -58.50 | VDDM : 1119.27 | AUX_INT :   -8.41 | CsaBias :   69.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03533e-03 / 2
  ADC_P0  : -8.41057e-03 ± 2.17397e-02
  ADC_P1  : 8.68695e-03 ± 5.46401e-04
  ADC_P2  : -6.59650e-06 ± 2.72630e-06
  CSA_Chi2/NDF : 1.69959e-04 / 2
  CSA_P0  : 5.95434e-02 ± 8.69550e-03
  CSA_P1  : 1.04822e-02 ± 6.55143e-04
  CSA_P2  : -5.52874e-05 ± 9.97705e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [39, 44, 63]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [24, 29, 45, 60, 63, 70, 71, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4421', '1.800', '0.1563', '1.800', '0.1013', '7.000', '0.7076', 1, 1, 1, 1, 1726137736.9194999]
VI_after__Init : ['1.202', '0.4424', '1.800', '0.1563', '1.800', '0.0954', '7.000', '0.7077', 1, 1, 1, 1, 1726137745.7388299]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1391', '1.800', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1726137809.08918]