TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_43_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-011-03 | FUSED_ID : 6359364768399138995
  IC_TEMP :  -53.35 | VDDM : 1133.96 | AUX_INT :   -6.64 | CsaBias :   76.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.20368e-04 / 2
  ADC_P0  : -6.63531e-03 ± 1.93844e-02
  ADC_P1  : 8.39710e-03 ± 4.83488e-04
  ADC_P2  : -5.58610e-06 ± 2.38375e-06
  CSA_Chi2/NDF : 1.18975e-04 / 2
  CSA_P0  : 5.80798e-02 ± 7.27528e-03
  CSA_P1  : 9.86363e-03 ± 5.48140e-04
  CSA_P2  : -4.49644e-05 ± 8.34752e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 17, 45, 50, 63, 75, 76, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [15, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1586', '1.800', '0.1525', '1.800', '0.0833', '7.000', '0.7078', 1, 1, 1, 1, 1726137833.471358]
VI_after__Init : ['1.202', '0.1586', '1.800', '0.1525', '1.800', '0.0781', '7.000', '0.7076', 1, 1, 1, 1, 1726137842.2517056]
VI_at__the_End : ['1.201', '0.4971', '1.800', '0.1408', '1.800', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1726137906.4079013]