TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_47_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-013-03 | FUSED_ID : 6359364768399139027
  IC_TEMP :  -54.60 | VDDM : 1132.57 | AUX_INT :   -7.25 | CsaBias :   85.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13488e-03 / 2
  ADC_P0  : -7.24820e-03 ± 2.28028e-02
  ADC_P1  : 8.50805e-03 ± 5.66984e-04
  ADC_P2  : -6.35497e-06 ± 2.77697e-06
  CSA_Chi2/NDF : 7.95961e-05 / 2
  CSA_P0  : 5.97648e-02 ± 5.95070e-03
  CSA_P1  : 9.58728e-03 ± 4.48343e-04
  CSA_P2  : -4.14274e-05 ± 6.82773e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 21, 58, 64, 86, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [39, 65, 83, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2966', '1.800', '0.1187', '1.800', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1726138029.07265]
VI_after__Init : ['1.202', '0.2967', '1.800', '0.1186', '1.800', '0.0841', '7.000', '0.7076', 1, 1, 1, 1, 1726138037.2491283]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1418', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726138100.2614086]