TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_50_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-015-03 | FUSED_ID : 6359364768399139059
  IC_TEMP :  -55.61 | VDDM : 1133.83 | AUX_INT :   -7.69 | CsaBias :   81.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02741e-03 / 2
  ADC_P0  : -7.68691e-03 ± 2.16950e-02
  ADC_P1  : 8.18008e-03 ± 5.21095e-04
  ADC_P2  : -5.52977e-06 ± 2.47950e-06
  CSA_Chi2/NDF : 1.03359e-04 / 2
  CSA_P0  : 6.10395e-02 ± 6.78104e-03
  CSA_P1  : 9.91339e-03 ± 5.10903e-04
  CSA_P2  : -4.61839e-05 ± 7.78044e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [0, 11, 46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [14, 46, 57, 78, 83, 106, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2838', '1.800', '0.1406', '1.800', '0.0873', '7.000', '0.7078', 1, 1, 1, 1, 1726138221.9932387]
VI_after__Init : ['1.202', '0.2837', '1.800', '0.1405', '1.800', '0.0822', '7.000', '0.7080', 1, 1, 1, 1, 1726138230.749606]
VI_at__the_End : ['1.202', '0.4983', '1.800', '0.1413', '1.800', '0.1111', '7.000', '0.7084', 1, 1, 1, 1, 1726138295.8226097]