TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_52_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-016-04 | FUSED_ID : 6359364768399139076
  IC_TEMP :  -55.58 | VDDM : 1128.82 | AUX_INT :   -7.87 | CsaBias :   67.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07147e-03 / 2
  ADC_P0  : -7.86533e-03 ± 2.21391e-02
  ADC_P1  : 8.39436e-03 ± 5.38074e-04
  ADC_P2  : -6.30765e-06 ± 2.58537e-06
  CSA_Chi2/NDF : 1.04017e-04 / 2
  CSA_P0  : 6.18016e-02 ± 6.80259e-03
  CSA_P1  : 9.79636e-03 ± 5.12526e-04
  CSA_P2  : -4.37614e-05 ± 7.80517e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [51, 66, 81, 86, 90, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 58, 63, 85, 107, 110, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3787', '1.800', '0.1528', '1.800', '0.0964', '7.000', '0.7079', 1, 1, 1, 1, 1726138319.894928]
VI_after__Init : ['1.202', '0.3784', '1.800', '0.1528', '1.800', '0.0907', '7.000', '0.7076', 1, 1, 1, 1, 1726138327.9892635]
VI_at__the_End : ['1.201', '0.5017', '1.800', '0.1433', '1.800', '0.1122', '7.000', '0.7084', 1, 1, 1, 1, 1726138393.5433564]