TEST_NAME : Wafer
TEST_DATE : 24_09_12-12_58_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-020-04 | FUSED_ID : 6359364768399139140
  IC_TEMP :  -53.61 | VDDM : 1140.70 | AUX_INT :   -6.26 | CsaBias :   70.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.84293e-04 / 2
  ADC_P0  : -6.25814e-03 ± 1.89599e-02
  ADC_P1  : 8.55474e-03 ± 4.83005e-04
  ADC_P2  : -5.75176e-06 ± 2.43100e-06
  CSA_Chi2/NDF : 1.37538e-04 / 2
  CSA_P0  : 6.24537e-02 ± 7.82228e-03
  CSA_P1  : 1.04378e-02 ± 5.89352e-04
  CSA_P2  : -5.06926e-05 ± 8.97514e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 22, 24, 51, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [48, 54, 76, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3152', '1.800', '0.1427', '1.800', '0.0880', '7.000', '0.7076', 1, 1, 1, 1, 1726138707.4675324]
VI_after__Init : ['1.202', '0.3152', '1.800', '0.1427', '1.800', '0.0824', '7.000', '0.7079', 1, 1, 1, 1, 1726138716.4089193]
VI_at__the_End : ['1.202', '0.5123', '1.800', '0.1444', '1.800', '0.1122', '7.000', '0.7085', 1, 1, 1, 1, 1726138775.7463365]