TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_00_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-021-04 | FUSED_ID : 6359364768399139156
  IC_TEMP :  -55.56 | VDDM : 1125.81 | AUX_INT :   -7.83 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14212e-03 / 2
  ADC_P0  : -7.83265e-03 ± 2.29234e-02
  ADC_P1  : 8.34954e-03 ± 5.68786e-04
  ADC_P2  : -5.27946e-06 ± 2.80247e-06
  CSA_Chi2/NDF : 1.13417e-04 / 2
  CSA_P0  : 6.08563e-02 ± 7.10332e-03
  CSA_P1  : 1.00602e-02 ± 5.35184e-04
  CSA_P2  : -4.95376e-05 ± 8.15022e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 41, 56, 97, 101, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 20, 31, 34, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2505', '1.800', '0.1339', '1.800', '0.0912', '7.000', '0.7077', 1, 1, 1, 1, 1726138804.7941456]
VI_after__Init : ['1.202', '0.2505', '1.800', '0.1339', '1.800', '0.0856', '7.000', '0.7078', 1, 1, 1, 1, 1726138813.003527]
VI_at__the_End : ['1.202', '0.4908', '1.800', '0.1428', '1.800', '0.1138', '7.000', '0.7084', 1, 1, 1, 1, 1726138872.9488876]