TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_08_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-010-026-04 | FUSED_ID : 6359364768399139236
  IC_TEMP :  -55.97 | VDDM : 1103.93 | AUX_INT :   -8.11 | CsaBias :   73.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64956e-03 / 2
  ADC_P0  : -8.10890e-03 ± 2.75815e-02
  ADC_P1  : 8.16684e-03 ± 6.62782e-04
  ADC_P2  : -5.31361e-06 ± 3.16313e-06
  CSA_Chi2/NDF : 1.10825e-04 / 2
  CSA_P0  : 5.74503e-02 ± 7.02167e-03
  CSA_P1  : 9.49096e-03 ± 5.29032e-04
  CSA_P2  : -4.42359e-05 ± 8.05653e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [13, 20, 36, 72, 79, 87, 105, 106, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [36, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2137', '1.800', '0.1486', '1.799', '0.0842', '7.000', '0.7080', 1, 1, 1, 1, 1726139289.4503329]
VI_after__Init : ['1.202', '0.2137', '1.800', '0.1485', '1.800', '0.0784', '7.000', '0.7079', 1, 1, 1, 1, 1726139297.7135892]
VI_at__the_End : ['1.202', '0.4741', '1.800', '0.1346', '1.800', '0.1080', '7.000', '0.7090', 1, 1, 1, 1, 1726139361.3067944]