TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_50_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-003-14 | FUSED_ID : 6359364768399142974
  IC_TEMP :  -53.57 | VDDM : 1126.31 | AUX_INT :   -7.29 | CsaBias :   73.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22436e-03 / 2
  ADC_P0  : -7.28692e-03 ± 2.37291e-02
  ADC_P1  : 8.17980e-03 ± 5.76095e-04
  ADC_P2  : -5.31657e-06 ± 2.76361e-06
  CSA_Chi2/NDF : 1.10099e-04 / 2
  CSA_P0  : 5.82588e-02 ± 6.99863e-03
  CSA_P1  : 9.73862e-03 ± 5.27297e-04
  CSA_P2  : -4.22262e-05 ± 8.03010e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [12, 36, 44, 54, 66, 71, 73, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [26, 34, 40, 87, 94, 95, 110, 113, 114, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1911', '1.800', '0.1651', '1.800', '0.0288', '7.000', '0.7062', 1, 1, 1, 1, 1726141805.7558858]
VI_after__Init : ['1.201', '0.1911', '1.800', '0.1651', '1.800', '0.0828', '7.000', '0.7081', 1, 1, 1, 1, 1726141813.8901985]
VI_at__the_End : ['1.201', '0.5004', '1.800', '0.1408', '1.800', '0.1121', '7.000', '0.7088', 1, 1, 1, 1, 1726141873.6195326]