TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_46_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-005-14 | FUSED_ID : 6359364768399143006
  IC_TEMP :  -59.49 | VDDM : 1138.62 | AUX_INT : -141.20 | CsaBias :  -27.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18677e-03 / 2
  ADC_P0  : -1.41199e-01 ± 3.00260e-02
  ADC_P1  : 1.05284e-02 ± 7.11775e-04
  ADC_P2  : -1.33085e-05 ± 3.30153e-06
  CSA_Chi2/NDF : 1.56102e-04 / 2
  CSA_P0  : 6.03120e-02 ± 8.33348e-03
  CSA_P1  : 1.00807e-02 ± 6.27868e-04
  CSA_P2  : -4.77945e-05 ± 9.56168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [21, 23, 27, 67, 69, 83, 99, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [14, 89, 92, 99, 109, 112, 113, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1776', '1.800', '0.1446', '1.799', '0.0842', '7.000', '0.7088', 1, 1, 1, 1, 1726141618.0525916]
VI_after__Init : ['1.202', '0.1778', '1.800', '0.1446', '1.800', '0.0768', '7.000', '0.7079', 1, 1, 1, 1, 1726141626.922889]
VI_at__the_End : ['1.202', '0.5024', '1.800', '0.1417', '1.800', '0.1108', '7.000', '0.7088', 1, 1, 1, 1, 1726141685.0962415]