TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_45_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-006-14 | FUSED_ID : 6359364768399143022
  IC_TEMP :  -52.00 | VDDM : 1123.73 | AUX_INT :   -9.47 | CsaBias :   93.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34566e-03 / 2
  ADC_P0  : -9.47453e-03 ± 2.48207e-02
  ADC_P1  : 8.01007e-03 ± 5.73677e-04
  ADC_P2  : -5.55343e-06 ± 2.63969e-06
  CSA_Chi2/NDF : 1.28363e-04 / 2
  CSA_P0  : 5.71372e-02 ± 7.55689e-03
  CSA_P1  : 9.82265e-03 ± 5.69357e-04
  CSA_P2  : -4.39544e-05 ± 8.67063e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 9, 18, 20, 53, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [26, 106, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1379', '1.800', '0.1307', '1.800', '0.0852', '7.000', '0.7090', 1, 1, 1, 1, 1726141521.0691457]
VI_after__Init : ['1.202', '0.1379', '1.800', '0.1306', '1.800', '0.0772', '7.000', '0.7081', 1, 1, 1, 1, 1726141529.8334649]
VI_at__the_End : ['1.200', '0.5003', '1.800', '0.1374', '1.800', '0.1113', '7.000', '0.7085', 1, 1, 1, 1, 1726141594.7682853]