TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_34_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-013-14 | FUSED_ID : 6359364768399143134
  IC_TEMP :  -57.32 | VDDM : 1127.68 | AUX_INT :   -9.42 | CsaBias :   76.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63344e-03 / 2
  ADC_P0  : -9.42306e-03 ± 2.73865e-02
  ADC_P1  : 8.71033e-03 ± 6.84294e-04
  ADC_P2  : -6.94053e-06 ± 3.38636e-06
  CSA_Chi2/NDF : 1.30170e-04 / 2
  CSA_P0  : 6.03594e-02 ± 7.60989e-03
  CSA_P1  : 9.92015e-03 ± 5.73351e-04
  CSA_P2  : -4.68690e-05 ± 8.73145e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [7, 59, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [35, 81, 96, 103, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3784', '1.800', '0.1509', '1.800', '0.0915', '7.000', '0.7082', 1, 1, 1, 1, 1726140841.2705882]
VI_after__Init : ['1.202', '0.3783', '1.800', '0.1509', '1.800', '0.0862', '7.000', '0.7083', 1, 1, 1, 1, 1726140849.3198981]
VI_at__the_End : ['1.195', '0.4892', '1.800', '0.1411', '1.800', '0.1126', '7.000', '0.7091', 1, 1, 1, 1, 1726140909.0381453]