TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_30_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-015-14 | FUSED_ID : 6359364768399143166
  IC_TEMP :  -53.20 | VDDM : 1127.57 | AUX_INT :   -6.66 | CsaBias :   76.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.26130e-04 / 2
  ADC_P0  : -6.65871e-03 ± 2.05515e-02
  ADC_P1  : 8.34528e-03 ± 4.95149e-04
  ADC_P2  : -6.36459e-06 ± 2.35747e-06
  CSA_Chi2/NDF : 8.00326e-05 / 2
  CSA_P0  : 5.85722e-02 ± 5.96700e-03
  CSA_P1  : 9.58980e-03 ± 4.49570e-04
  CSA_P2  : -4.12470e-05 ± 6.84642e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 58, 79, 104, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [6, 102, 109, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2598', '1.800', '0.1446', '1.800', '0.0892', '7.000', '0.7080', 1, 1, 1, 1, 1726140647.0490074]
VI_after__Init : ['1.202', '0.2598', '1.800', '0.1445', '1.800', '0.0836', '7.000', '0.7081', 1, 1, 1, 1, 1726140654.9823945]
VI_at__the_End : ['1.202', '0.4958', '1.800', '0.1407', '1.800', '0.1124', '7.000', '0.7087', 1, 1, 1, 1, 1726140719.43719]