TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_27_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-017-09 | FUSED_ID : 6359364768399143193
  IC_TEMP :  -55.49 | VDDM : 1128.21 | AUX_INT :   -7.94 | CsaBias :   76.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13228e-03 / 2
  ADC_P0  : -7.94320e-03 ± 2.27661e-02
  ADC_P1  : 8.54050e-03 ± 5.64838e-04
  ADC_P2  : -6.44079e-06 ± 2.76912e-06
  CSA_Chi2/NDF : 1.20180e-04 / 2
  CSA_P0  : 6.12082e-02 ± 7.31203e-03
  CSA_P1  : 1.00195e-02 ± 5.50909e-04
  CSA_P2  : -4.70606e-05 ± 8.38969e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [12, 24, 43, 51, 54, 59, 63, 65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [0, 29, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2048', '1.800', '0.1533', '1.800', '0.0851', '7.000', '0.7081', 1, 1, 1, 1, 1726140452.0546675]
VI_after__Init : ['1.201', '0.2047', '1.800', '0.1533', '1.800', '0.0797', '7.000', '0.7079', 1, 1, 1, 1, 1726140460.8289475]
VI_at__the_End : ['1.202', '0.5029', '1.800', '0.1410', '1.799', '0.1132', '7.000', '0.7087', 1, 1, 1, 1, 1726140523.077907]