TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_22_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-020-09 | FUSED_ID : 6359364768399143241
  IC_TEMP :  -51.51 | VDDM : 1108.18 | AUX_INT :  -10.44 | CsaBias :   81.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65336e-03 / 2
  ADC_P0  : -1.04366e-02 ± 2.75300e-02
  ADC_P1  : 8.41933e-03 ± 6.60726e-04
  ADC_P2  : -6.41278e-06 ± 3.16056e-06
  CSA_Chi2/NDF : 6.36594e-05 / 2
  CSA_P0  : 5.88456e-02 ± 5.32174e-03
  CSA_P1  : 9.10963e-03 ± 4.00955e-04
  CSA_P2  : -3.50138e-05 ± 6.10606e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 5, 53, 83, 85, 116, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [34, 37, 41, 51, 52, 66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1778', '1.800', '0.1540', '1.800', '0.0883', '7.000', '0.7081', 1, 1, 1, 1, 1726140161.0364826]
VI_after__Init : ['1.201', '0.1778', '1.800', '0.1540', '1.800', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1726140169.8067849]
VI_at__the_End : ['1.202', '0.4912', '1.800', '0.1395', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726140231.5406923]