TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_21_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-021-09 | FUSED_ID : 6359364768399143257
  IC_TEMP :  -51.36 | VDDM : 1110.62 | AUX_INT :   -6.20 | CsaBias :   87.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01524e-03 / 2
  ADC_P0  : -6.20290e-03 ± 2.16207e-02
  ADC_P1  : 7.82698e-03 ± 5.10180e-04
  ADC_P2  : -4.28116e-06 ± 2.38980e-06
  CSA_Chi2/NDF : 7.19986e-05 / 2
  CSA_P0  : 6.06247e-02 ± 5.65958e-03
  CSA_P1  : 9.35741e-03 ± 4.26409e-04
  CSA_P2  : -4.03749e-05 ± 6.49370e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 27, 40, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [60, 63, 89, 98, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3470', '1.800', '0.1234', '1.800', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1726140064.7894988]
VI_after__Init : ['1.202', '0.3473', '1.800', '0.1235', '1.800', '0.0800', '7.000', '0.7080', 1, 1, 1, 1, 1726140072.8999212]
VI_at__the_End : ['1.201', '0.4860', '1.800', '0.1404', '1.800', '0.1129', '7.000', '0.7087', 1, 1, 1, 1, 1726140137.5214708]