TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_19_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-022-09 | FUSED_ID : 6359364768399143273
  IC_TEMP :  -56.16 | VDDM : 1120.04 | AUX_INT :   -8.15 | CsaBias :   73.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05598e-03 / 2
  ADC_P0  : -8.14679e-03 ± 2.19783e-02
  ADC_P1  : 8.23614e-03 ± 5.25106e-04
  ADC_P2  : -5.91064e-06 ± 2.48720e-06
  CSA_Chi2/NDF : 1.34674e-04 / 2
  CSA_P0  : 6.07983e-02 ± 7.74040e-03
  CSA_P1  : 9.69435e-03 ± 5.83183e-04
  CSA_P2  : -4.37565e-05 ± 8.88119e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [64, 103, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 18, 74, 80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2478', '1.800', '0.1422', '1.799', '0.0860', '7.000', '0.7079', 1, 1, 1, 1, 1726139967.2498345]
VI_after__Init : ['1.202', '0.2477', '1.800', '0.1421', '1.800', '0.0803', '7.000', '0.7081', 1, 1, 1, 1, 1726139975.4471798]
VI_at__the_End : ['1.202', '0.4938', '1.800', '0.1389', '1.800', '0.1119', '7.000', '0.7086', 1, 1, 1, 1, 1726140038.212806]