TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_16_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-024-09 | FUSED_ID : 6359364768399143305
  IC_TEMP :  -56.98 | VDDM : 1125.70 | AUX_INT :   -8.09 | CsaBias :   78.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21581e-03 / 2
  ADC_P0  : -8.08944e-03 ± 2.36126e-02
  ADC_P1  : 7.94744e-03 ± 5.48054e-04
  ADC_P2  : -5.38282e-06 ± 2.51759e-06
  CSA_Chi2/NDF : 1.30977e-04 / 2
  CSA_P0  : 5.86423e-02 ± 7.63344e-03
  CSA_P1  : 9.69336e-03 ± 5.75125e-04
  CSA_P2  : -4.37913e-05 ± 8.75847e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [37, 56, 63, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [28, 55, 108, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2714', '1.800', '0.1624', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1726139774.007572]
VI_after__Init : ['1.201', '0.2715', '1.800', '0.1624', '1.799', '0.0814', '7.000', '0.7079', 1, 1, 1, 1, 1726139782.2508538]
VI_at__the_End : ['1.202', '0.4916', '1.800', '0.1373', '1.800', '0.1128', '7.000', '0.7084', 1, 1, 1, 1, 1726139845.657355]