TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_13_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-026-09 | FUSED_ID : 6359364768399143337
  IC_TEMP :  -57.81 | VDDM : 1119.95 | AUX_INT :   -8.29 | CsaBias :   66.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40502e-03 / 2
  ADC_P0  : -8.28880e-03 ± 2.54635e-02
  ADC_P1  : 8.37259e-03 ± 6.37466e-04
  ADC_P2  : -5.06305e-06 ± 3.17063e-06
  CSA_Chi2/NDF : 1.44901e-04 / 2
  CSA_P0  : 5.86994e-02 ± 8.02895e-03
  CSA_P1  : 9.62167e-03 ± 6.04923e-04
  CSA_P2  : -4.68215e-05 ± 9.21226e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 16, 24, 40, 42, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 33, 53, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1342', '1.800', '0.1466', '1.800', '0.0791', '7.000', '0.7078', 1, 1, 1, 1, 1726139580.6740434]
VI_after__Init : ['1.202', '0.1341', '1.800', '0.1465', '1.800', '0.0734', '7.000', '0.7077', 1, 1, 1, 1, 1726139588.79348]
VI_at__the_End : ['1.202', '0.4733', '1.800', '0.1394', '1.800', '0.1109', '7.000', '0.7088', 1, 1, 1, 1, 1726139652.420611]