TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_56_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-004-06 | FUSED_ID : 6359364768399147078
  IC_TEMP :  -55.01 | VDDM : 1132.33 | AUX_INT :   -9.20 | CsaBias :   73.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35453e-03 / 2
  ADC_P0  : -9.19524e-03 ± 2.49105e-02
  ADC_P1  : 8.30670e-03 ± 5.97162e-04
  ADC_P2  : -6.07760e-06 ± 2.84128e-06
  CSA_Chi2/NDF : 1.04049e-04 / 2
  CSA_P0  : 5.84140e-02 ± 6.80364e-03
  CSA_P1  : 9.60740e-03 ± 5.12605e-04
  CSA_P2  : -4.03611e-05 ± 7.80637e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [13, 19, 35, 38, 70, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [9, 22, 38, 64, 92, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3715', '1.800', '0.1381', '1.800', '0.0909', '7.000', '0.7089', 1, 1, 1, 1, 1726142194.2916307]
VI_after__Init : ['1.202', '0.3715', '1.800', '0.1380', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1726142202.437954]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1365', '1.800', '0.1090', '7.000', '0.7086', 1, 1, 1, 1, 1726142262.953298]