TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_58_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-005-06 | FUSED_ID : 6359364768399147094
  IC_TEMP :  -54.40 | VDDM : 1126.32 | AUX_INT :   -8.92 | CsaBias :   88.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38249e-03 / 2
  ADC_P0  : -8.92421e-03 ± 2.52209e-02
  ADC_P1  : 8.14035e-03 ± 6.02764e-04
  ADC_P2  : -5.26579e-06 ± 2.86631e-06
  CSA_Chi2/NDF : 1.05884e-04 / 2
  CSA_P0  : 5.85539e-02 ± 6.86336e-03
  CSA_P1  : 9.72434e-03 ± 5.17105e-04
  CSA_P2  : -4.21211e-05 ± 7.87489e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 33, 35, 37, 52, 56, 69, 93, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [19, 29, 44, 45, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3437', '1.800', '0.1485', '1.800', '0.0904', '7.000', '0.7080', 1, 1, 1, 1, 1726142292.0728946]
VI_after__Init : ['1.201', '0.3438', '1.800', '0.1485', '1.800', '0.0846', '7.000', '0.7081', 1, 1, 1, 1, 1726142300.270373]
VI_at__the_End : ['1.202', '0.4997', '1.800', '0.1416', '1.800', '0.1115', '7.000', '0.7088', 1, 1, 1, 1, 1726142360.2356858]