TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_01_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-007-06 | FUSED_ID : 6359364768399147126
  IC_TEMP :  -52.69 | VDDM : 1132.12 | AUX_INT :   -7.33 | CsaBias :   90.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50070e-03 / 2
  ADC_P0  : -7.32751e-03 ± 2.63833e-02
  ADC_P1  : 8.16441e-03 ± 6.59660e-04
  ADC_P2  : -4.09539e-06 ± 3.27511e-06
  CSA_Chi2/NDF : 1.24222e-04 / 2
  CSA_P0  : 5.91041e-02 ± 7.43397e-03
  CSA_P1  : 9.71825e-03 ± 5.60096e-04
  CSA_P2  : -4.20127e-05 ± 8.52960e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 54, 74, 113, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [10, 17, 19, 44, 51, 82]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2793', '1.800', '0.1363', '1.800', '0.0906', '7.000', '0.7089', 1, 1, 1, 1, 1726142486.1997814]
VI_after__Init : ['1.202', '0.2795', '1.800', '0.1363', '1.800', '0.0831', '7.000', '0.7081', 1, 1, 1, 1, 1726142494.911237]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1439', '1.800', '0.1135', '7.000', '0.7089', 1, 1, 1, 1, 1726142562.9548218]