TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_04_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-009-06 | FUSED_ID : 6359364768399147158
  IC_TEMP :  -52.39 | VDDM : 1134.23 | AUX_INT :   -6.67 | CsaBias :   82.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00300e-03 / 2
  ADC_P0  : -6.66514e-03 ± 2.14358e-02
  ADC_P1  : 8.17463e-03 ± 5.14868e-04
  ADC_P2  : -5.52052e-06 ± 2.44987e-06
  CSA_Chi2/NDF : 1.30276e-04 / 2
  CSA_P0  : 6.04051e-02 ± 7.61297e-03
  CSA_P1  : 9.95427e-03 ± 5.73583e-04
  CSA_P2  : -4.58565e-05 ± 8.73498e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [48, 53, 55, 74, 77, 87, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [18, 71, 82, 88, 108, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2946', '1.800', '0.1573', '1.800', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1726142679.829779]
VI_after__Init : ['1.202', '0.2947', '1.800', '0.1573', '1.799', '0.0796', '7.000', '0.7081', 1, 1, 1, 1, 1726142688.0062075]
VI_at__the_End : ['1.202', '0.5043', '1.800', '0.1405', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1726142756.7148426]